发明名称 MEASURING METHOD FOR MINUTE DIAMETER CHANGE AND THICKNESS OF THIN TUBE USING RESONANT FAR-FREQUENCY AND THICKNESS RESONANCE AND DEVICE THEREOF
摘要 PURPOSE: A method and a device are provided to measure a minute change of the diameter of a tube using a resonant far-frequency, not having a delay material in front face of a sensor. CONSTITUTION: The measuring device for the diameter change and the thickness of the thin tube comprises:a driving device unit of a probe having a manipulator contacted a transmitting and a receiving probe and a controller to remote control it; a pulse generating device or synthesizer to generate a supersonic wave pulse in the transmitting probe, and to receive a resonance supersonic wave from the receiving probe; a wave form a digitizer to digit a gathering signal; a computer to measure a resonance spectrum.
申请公布号 KR20000001021(A) 申请公布日期 2000.01.15
申请号 KR19980021043 申请日期 1998.06.08
申请人 KOREA ELECTRIC POWER CORPORATION;KOREA ATOMIC ENERGY RESEARCH INSTITUTE 发明人 JU, YOUNG SANG;SHIM, CHUL MOO;JUNG, YONG MOO;JUNG, HYUN KYU
分类号 G01B17/00;(IPC1-7):G01B17/00 主分类号 G01B17/00
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