发明名称 REPAIR CIRCUIT OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A repair circuit of semiconductor device is provided to use a spare word line efficiently by replacing the divided spare word line in repair. CONSTITUTION: A semiconductor device comprises a row decoder for selecting a sub-word line driver selecting a main word line in response to an address signal, a first input buffer, a second input buffer for receiving an output signal from the first input buffer and the address signal, and a pre-row decoder for outputting a normal sub-word line driver driving signal in response to an output signal from the second input buffer. The semiconductor device further comprises a redundant row decoder for selecting a repair sub-word line in response to the output signal from the second input buffer. The semiconductor device uses the spare word lines maximally, so that the semiconductor device can improve a yield of the semiconductor device.
申请公布号 KR20000000718(A) 申请公布日期 2000.01.15
申请号 KR19980020505 申请日期 1998.06.03
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 LEE, SANG PIL
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
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