发明名称 |
PRODUCTION METHOD FOR POLYCIDE GATE |
摘要 |
PURPOSE: A production method for a polycide gate is provided to prevent the deterioration of a gate oxide film by preventing an unreacted Titanium inside TiSi2 film from passing and diffusing up to the gate oxide film when forming the polycide gate. CONSTITUTION: The production method of the semiconductor element comprises a step of: laminating a gate isolation film and a polysilicon film on a semiconductor substrate(21) in order; injecting nitrogen inside a polysilicon film; forming the TiSi2 film(25) on the polysilicon film.
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申请公布号 |
KR20000003473(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980024715 |
申请日期 |
1998.06.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
KIM, HYUN SU |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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