发明名称 |
GATE ELECTRODE AND BIT LINE CREATING METHOD OF SEMICONDUCTOR DEVICE USING TITANIUM SILICIDE |
摘要 |
PURPOSE: A gate electrode and a bit line creating method of a semiconductor device using titanium silicide is provided to solve the problem that resistance of the gate electrode rises. CONSTITUTION: The semiconductor device manufacturing method comprises the steps of: forming a polysilicon film(13) pattern that makes the gate electrode on a gate oxide film(12) of a semiconductor substrate(10); forming a first interlayer insulating film(15) on the entire structure; forming a first contact hole(17A) that exposes a polysilicon film pattern by selectively etching the first interlayer insulating film; and forming the gate electrode that is made into the first titanium silicide and the polysilicon film pattern by filling the first titanium silicide inside the first contact hole.
|
申请公布号 |
KR20000003467(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980024709 |
申请日期 |
1998.06.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
KIM, YOUNG JOONG |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|