发明名称 GATE ELECTRODE AND BIT LINE CREATING METHOD OF SEMICONDUCTOR DEVICE USING TITANIUM SILICIDE
摘要 PURPOSE: A gate electrode and a bit line creating method of a semiconductor device using titanium silicide is provided to solve the problem that resistance of the gate electrode rises. CONSTITUTION: The semiconductor device manufacturing method comprises the steps of: forming a polysilicon film(13) pattern that makes the gate electrode on a gate oxide film(12) of a semiconductor substrate(10); forming a first interlayer insulating film(15) on the entire structure; forming a first contact hole(17A) that exposes a polysilicon film pattern by selectively etching the first interlayer insulating film; and forming the gate electrode that is made into the first titanium silicide and the polysilicon film pattern by filling the first titanium silicide inside the first contact hole.
申请公布号 KR20000003467(A) 申请公布日期 2000.01.15
申请号 KR19980024709 申请日期 1998.06.29
申请人 HYUNDAI ELECTRONICS IND. CO., LTD. 发明人 KIM, YOUNG JOONG
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
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