发明名称 METHOD FOR FORMING CONTACT HOLE OF SEMICONDUCTOR MEMORY APPARATUS
摘要 PURPOSE: A method for forming a contact hole of a semiconductor memory apparatus is provided to prevent a junctional layer generated while etching the contact hole from damage. CONSTITUTION: A method for forming a contact hole in a cell area and an around area of a semiconductor memory apparatus containing a difference of steps comprises: forming an interlayer insulating film covering a lower layer; ion injecting selectively into the interlayer insulating film of the contact hole forming area of the cell area for forming a latticed damaging unit; and selectively etching the interlayer insulating film in the cell area and the around area for forming the contact hole.
申请公布号 KR20000003356(A) 申请公布日期 2000.01.15
申请号 KR19980024586 申请日期 1998.06.27
申请人 HYUNDAI ELECTRONICS IND. CO., LTD 发明人 KIM, JANG SIK;KIM, WOO HYUN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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