COMPONENTS CLINCH EXAMINING METHOD AND DEVICE OF PRINTED CIRCUIT BOARD

摘要

PURPOSE: A component clinch examination method is provided to minimize the fault of clinch examination of the circuit components inserted into a printed circuit board. CONSTITUTION: A clinch examination method of components of a printed circuit board contains the steps of: dividing the lead of each circuit component included in a database for examining a clinch among the plural circuit components into plural segments; reading and outputting the information of a hole pattern where one segment is connected and a hole pattern where the selected circuit components are going to be inserted; performing the clinch fault examination of the circuit components included in the database for the clinch examining and the plural segments of the selected circuit components.