HANDLER SYSTEM FOR AUTOMATICALLY TESTING A SEMICONDUCTOR DEVICE

摘要

PURPOSE: A handler system is provided to prevent a product from being damaged at an input and/or an output of a tray or a user tray. CONSTITUTION: The handler system for automatically testing a semiconductor device comprises: a cabinet(10) disposed so as to be return a test tray; a tray load unit placed at a center of the cabinet, for loading a plurality of trays(11) and user trays(12); a tray transport unit moving in vertical and horizontal directions and transferring the trays and/or the user trays loaded on the tray load unit toward a gripper(30); a pair of loader pick and places(60) for picking up a device loaded on the tray transferred by the tray transport unit to transfer the device thus picked up to the test tray; a pair of unloader pick and places(60) for picking up the device loaded the test tray to again transfer the device depending on a category of the user tray; chambers(81, 82) disposed between the pick and places of the pair, for previous-heating the device and for returning the previously heated device; a tester(80) placed below the cabinet, for testing the device transferred from the loader pick and place; and a control unit(83) for automatically controlling a temperature of the chambers depending on a result of the tester.