| 摘要 |
PURPOSE: An image sensor for estimating the characteristics of color filters on a wafer is provided to reduce test cost and to improve the test correctness and the product yield. CONSTITUTION: The image sensor is formed together with color filters on a wafer. The image sensor has a structure for estimating the characteristics of color filters. In a embodiment, an image sensor includes a first light sensing element(203a) with no color filters thereon, a second light sensing element(203b) with a first color filter covered thereon, a third light sensing element(203c) with a second color filter covered thereon, a fourth light sensing element(203d) with a third color filter covered thereon, and a meter for detecting currents conducted by photons from the light sensing elements.
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