发明名称 |
METHOD OF MANUFACTURING A TRANSISTOR OF A SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method of manufacturing a transistor of a semiconductor device is provided to maintain the quantity of current by reducing the resistance of a lightly doped drain(LDD) region. CONSTITUTION: A method of manufacturing a transistor of a semiconductor device comprises the steps of: evaporating a gate oxidation layer, a polysilicon layer and a titanium layer, and patterning by under-etching titanium layer and the polysilicon layer; forming a lightly doped drain(LDD) region by injecting ions to regions of both sides of the titanium layer and the polysilicon layer etched after the patterning, and multi-laying an upper polysilicon layer; exposing the titanium layer by etching the upper polysilicon layer and forming a poly-spacer layer on both sides of the polysilicon layer; forming source/drain regions by injecting ions into the LDD region and forming a titanium-silicide layer by annealing.
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申请公布号 |
KR20000001085(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980021131 |
申请日期 |
1998.06.08 |
申请人 |
HYUNDAI ELECTRIC INDUSTRY CO., LTD. |
发明人 |
O, SE JUNG |
分类号 |
H01L21/33;(IPC1-7):H01L21/33 |
主分类号 |
H01L21/33 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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