发明名称 METHOD OF MANUFACTURING A TRANSISTOR OF A SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of manufacturing a transistor of a semiconductor device is provided to maintain the quantity of current by reducing the resistance of a lightly doped drain(LDD) region. CONSTITUTION: A method of manufacturing a transistor of a semiconductor device comprises the steps of: evaporating a gate oxidation layer, a polysilicon layer and a titanium layer, and patterning by under-etching titanium layer and the polysilicon layer; forming a lightly doped drain(LDD) region by injecting ions to regions of both sides of the titanium layer and the polysilicon layer etched after the patterning, and multi-laying an upper polysilicon layer; exposing the titanium layer by etching the upper polysilicon layer and forming a poly-spacer layer on both sides of the polysilicon layer; forming source/drain regions by injecting ions into the LDD region and forming a titanium-silicide layer by annealing.
申请公布号 KR20000001085(A) 申请公布日期 2000.01.15
申请号 KR19980021131 申请日期 1998.06.08
申请人 HYUNDAI ELECTRIC INDUSTRY CO., LTD. 发明人 O, SE JUNG
分类号 H01L21/33;(IPC1-7):H01L21/33 主分类号 H01L21/33
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