CHECKING METHOD OF LINE/ROW REDUNDANCY REPAIR FOR SEMICONDUCTOR DEVICE

摘要

PURPOSE: A checking method of yes or no of a line/row redundancy repair of a memory cell for a semiconductor device is provided to check only by a current value of a pad contacted with a signal fuse. CONSTITUTION: The checking method of a line/row redundancy repair for a semiconductor device comprises: each combination of a blowing of a first fuse contacted with a light enable pad(11) and a second fuse contacted into an output enable pad, appointed a line or a row redundancy repair; to previously establish inside the semiconductor device; to be able to check the line or the row redundancy repair by a current value measured in the first pad(11) and the second pad.