| 摘要 |
PURPOSE: A diagonal burst access circuit is provided to perform read/write operation by accessing address once without additional column access operation. CONSTITUTION: A semiconductor device performing row access and column access, comprises a transmitting control circuit transmitting X-address information generated from a global X-address decoder located in a row access path into a Y-address in response to a diagonal test mode signal, a morse circuit converting the Y-address information from a global Y-address decoder located in a column access path into a meaningless information in response to the inputted diagonal test mode signal, and a logical operation circuit performing logical operation of the information from the transmitting control circuit and the global Y-address decoder, and outputting the result of the logical operation to a bank Y-address decoder. The global Y-address decoder further comprises a level maintenance circuit for maintaining its output at a fixed level in a diagonal mode. Thus, the read/write operation is performed to the diagonal direction by accessing address once, so that a productivity can be improved and a test screen can be simplified by reducing test time.
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