发明名称 |
METHOD FOR MANUFACTURING MEMORY DEVICES |
摘要 |
PURPOSE: A fabrication method of memory devices is provided to improve a productivity by simplifying the manufacturing process using a single mask. CONSTITUTION: The method comprises the steps of: coating a first photo-resist(12) on a semiconductor substrate(10) and patterning the coated first photo-resist(12); exposing the remained first photo-resist; ion-implanting into the exposed semiconductor substrate(10); coating a second photo-resist(14) in the region removed the first photo-resist; ashing the first and the second photo-resists(14,12) and entirely removing the exposed first photo-resist; and stripping the second photo-resist to entirely remove the second photo-resist.
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申请公布号 |
KR20000001223(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980021368 |
申请日期 |
1998.06.09 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
SEONG, JUN SEOK |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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