发明名称 METHOD FOR ISOLATING TRENCH
摘要 PURPOSE: An isolated formation method for a trench is provided to reduce a strip time of an active nitride film and to prevent the oxidation preventive nitride film from being etched and dented while stripping the active nitride film. CONSTITUTION: An isolated formation method for a trench includes; defining a trench forming area(203) on a semiconductor substrate(200) for forming a trench mask layer including an active nitride film; etching the semiconductor substrate by using the trench mask layer for forming the trench; and forming an oxidized film on the trench floor and the both walls for eliminating a damage of the semiconductor substrate generated in the trench forming process.
申请公布号 KR20000002040(A) 申请公布日期 2000.01.15
申请号 KR19980022584 申请日期 1998.06.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG, GEE HYUN;NAM, SUK WOO
分类号 H01L21/76;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L21/76
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