发明名称 |
METHOD FOR ISOLATING TRENCH |
摘要 |
PURPOSE: An isolated formation method for a trench is provided to reduce a strip time of an active nitride film and to prevent the oxidation preventive nitride film from being etched and dented while stripping the active nitride film. CONSTITUTION: An isolated formation method for a trench includes; defining a trench forming area(203) on a semiconductor substrate(200) for forming a trench mask layer including an active nitride film; etching the semiconductor substrate by using the trench mask layer for forming the trench; and forming an oxidized film on the trench floor and the both walls for eliminating a damage of the semiconductor substrate generated in the trench forming process.
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申请公布号 |
KR20000002040(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980022584 |
申请日期 |
1998.06.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HWANG, GEE HYUN;NAM, SUK WOO |
分类号 |
H01L21/76;H01L21/762;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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