发明名称 |
FINE CONTACT HOLE FORMING METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A fine contact hole forming the method of a semiconductor device is provided to easily form the fine contact hole by increasing a process spare degree by preventing a damage of an electrode and a short between electrodes. CONSTITUTION: The fine contact hole forming method of a semiconductor device comprises the steps of: evaporating an electric conduction material for a gate electrode formation on a semiconductor substrate; forming the gate electrode by patterning the upper part of the electric conduction material for the gate electrode; evaporating in order an oxide film and a nitride film for stopping etching on the upper part of the whole structure; forming a nitride film spacer on both side walls of a pattern after etching the nitride film for stopping etching; evaporating an insulation oxide film in a certain thickness; opening the upper part of a multi crystal silicon for a hard disk; forming a contact hole; forming a contact plug inside the contact.
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申请公布号 |
KR20000003618(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980024878 |
申请日期 |
1998.06.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
KIM, GEON TAE |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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