发明名称 FINE CONTACT HOLE FORMING METHOD OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A fine contact hole forming the method of a semiconductor device is provided to easily form the fine contact hole by increasing a process spare degree by preventing a damage of an electrode and a short between electrodes. CONSTITUTION: The fine contact hole forming method of a semiconductor device comprises the steps of: evaporating an electric conduction material for a gate electrode formation on a semiconductor substrate; forming the gate electrode by patterning the upper part of the electric conduction material for the gate electrode; evaporating in order an oxide film and a nitride film for stopping etching on the upper part of the whole structure; forming a nitride film spacer on both side walls of a pattern after etching the nitride film for stopping etching; evaporating an insulation oxide film in a certain thickness; opening the upper part of a multi crystal silicon for a hard disk; forming a contact hole; forming a contact plug inside the contact.
申请公布号 KR20000003618(A) 申请公布日期 2000.01.15
申请号 KR19980024878 申请日期 1998.06.29
申请人 HYUNDAI ELECTRONICS IND. CO., LTD 发明人 KIM, GEON TAE
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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