发明名称 |
MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A manufacturing method for a semiconductor element is provided to secure a margin of a gate electrode and a conductive layer for preventing contacting each other and for improving a reliability of a processing yield rate and a device movement. CONSTITUTION: A manufacturing method for a semiconductor element comprises: forming successively a gate insulating film(14), a first conductive layer for a gate electrode, and a mask insulating film(18) on the upper part of a semiconductor substrate(12); forming a photo sensitive film pattern(20) on the upper unit of the mask insulating film; forming a mask insulating film pattern by etching process; eliminating the photo sensitive pattern; forming a first insulating film(22) spacer on the both side walls of the mask insulating film pattern; forming the gate electrode by etching the first conductive layer; forming a second insulating film(24) spacer on the both side walls of the first insulating film spacer and the gate electrode; forming a source/drain area in the semiconductor substrate on the both sides of the gate electrode; and forming a second conductive layer on the upper part of the structure.
|
申请公布号 |
KR20000003597(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980024857 |
申请日期 |
1998.06.29 |
申请人 |
HYUNDAI ELECTRONICS IND.CO., LTD |
发明人 |
KIM, DAE YOUNG |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|