发明名称 |
SOI SUBSTRATE MANUFACTURING METHOD |
摘要 |
PURPOSE: A silicon-on-insulator(SOI) substrate manufacturing method is provided to obtain the even silicon active layer by preventing the dishing phenomenon generated when polishing the silicon. CONSTITUTION: The both SOI substrate and device separating film manufacturing method comprises the steps of: forming a field oxidizing film on a first semiconductor substrate(21) by the partial oxidizing process; forming an impurity doping layer in the first semiconductor substrate(21); forming an insulating film(25) flatten on the whole surface of the substrate(21); binding a second semiconductor substrate(26) on the surface of the insulating film(25); primary polishing the rear face of the first semiconductor substrate(21) to the upper area of the impurity doping layer; flatting by wetting etching the rear face of the first semiconductor substrate(21) by using the impurity doping layer as an etching stop layer; and secondarily polishing the rear face of the first semiconductor substrate(21) until the insulating film(25) is exposed.
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申请公布号 |
KR20000003471(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980024713 |
申请日期 |
1998.06.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
LEE, SUNG EUN |
分类号 |
H01L21/20;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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