发明名称 |
CONDUCTOR PLUG FORMING METHOD FOR WIRING MULTI-LAYER OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A conductor plug forming method for wiring multi-layer of a semiconductor device is provided to improve the device efficiency by minimizing the defect of burying tungsten or the adhesive strength between the attaching membrane and the conductor. CONSTITUTION: A conductor plug comprises the steps of: forming an opening so the upper face of wired layer of the lower part surrounded by an insulating layer between layers as to be opened; forming an attaching membrane on the insulating layer between layers having the opening; attaching the 1st conductor on the attaching membrane in a thickness as 50¯60% as the conductor to fill the opening up; etching the 1st conductor and the attaching membrane(104); forming a wall metal membrane(108) on the insulating membrane between layers.
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申请公布号 |
KR20000002767(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980023675 |
申请日期 |
1998.06.23 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
LEE, JONG HYUP |
分类号 |
H01L21/31;(IPC1-7):H01L21/31 |
主分类号 |
H01L21/31 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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