发明名称 |
PHASE INVERSION MASK FORMING METHOD |
摘要 |
PURPOSE: A phase inversion mask forming method is provided to prevent damages to the photo interceptive layer by forming a photo interceptive layer on the top or at the back of the transparent substrate. CONSTITUTION: The phase inversion mask forming method comprises steps of; layering a phase inversion layer(120) on the top of the transparent substrate(110); forming a photoresist layer(130) on the phase inversion layer(120); patterning a photoresist layer(130) and forming an opening(160) to expose part of the inversion layer(120); forming a photo translucent layer(140) by oxidizing phase inversion layer(120).
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申请公布号 |
KR20000002751(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980023655 |
申请日期 |
1998.06.23 |
申请人 |
DAEWOO ELECTRONICS CO., LTD. |
发明人 |
NOH, JAE WOO |
分类号 |
H01L21/027;(IPC1-7):H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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