发明名称 PHASE INVERSION MASK FORMING METHOD
摘要 PURPOSE: A phase inversion mask forming method is provided to prevent damages to the photo interceptive layer by forming a photo interceptive layer on the top or at the back of the transparent substrate. CONSTITUTION: The phase inversion mask forming method comprises steps of; layering a phase inversion layer(120) on the top of the transparent substrate(110); forming a photoresist layer(130) on the phase inversion layer(120); patterning a photoresist layer(130) and forming an opening(160) to expose part of the inversion layer(120); forming a photo translucent layer(140) by oxidizing phase inversion layer(120).
申请公布号 KR20000002751(A) 申请公布日期 2000.01.15
申请号 KR19980023655 申请日期 1998.06.23
申请人 DAEWOO ELECTRONICS CO., LTD. 发明人 NOH, JAE WOO
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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