发明名称 METHOD AND DEVICE FOR STORING SEMICONDUCTOR WAFER
摘要 <p>PROBLEM TO BE SOLVED: To suppress chemical contamination on a semiconductor wafer by storing the semiconductor wafer in the volatile gaseous phase of a volatile organic solvent whose adhesion probability is equal to or less than specified. SOLUTION: A semiconductor wafer is washed with a chemical liquid, is rinsed with ultra-pure water, and is dried. Immediately after this, the semiconductor wafer is retained in a gas atmosphere containing a volatile organic solvent with an adhesion probability of 1/1,000 or less. In this manner, by allowing a large amount of volatile organic solvent with an adhesion probability of 1,000 or less to exist other than an organic matter with a high adhesion probability, the volatile organic solvent with an adhesion probability of 1/1,000 or less frequently repeats adhesion and elimination and an organic matter with a high adhesion probability adheres to an adsorption site with less probability in the adsorption site on the wafer surface. Also, immediately after the wafer is taken out of a storage container, the volatile organic solvent existing in the attraction site is discharged into air and the wafer surface becomes clean.</p>
申请公布号 JP2000012671(A) 申请公布日期 2000.01.14
申请号 JP19980179233 申请日期 1998.06.25
申请人 NIPPON STEEL CORP 发明人 MORIMOTO TOSHIHIRO;KAMIMURA KENICHI
分类号 B65D73/02;B65D65/40;H01L21/02;H01L21/304;H01L21/673;H01L21/68;(IPC1-7):H01L21/68 主分类号 B65D73/02
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