发明名称 |
REPAIR CIRCUIT HAVING ANTI-FUSE AND PROGRAMMING UNIT FOR PROGRAMMING REDUNDANT CELLS AND MANUFACTURING ANTI-FUSE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a repair circuit having an anti-fuse and a programming unit for programming redundant cells, without using a high-cost laser apparatus. SOLUTION: The anti-fuse 20 of the repair circuit comprises a lower electrode 23 having a spacer 23 which has a sharp point inclined at one side and is highly formed on an outside part, a dielectric film formed on the lower electrode 23, and an upper electrode 28 formed on the dielectric film. In programming defective memory cells, a part of the dielectric film bonded to the space of the lower electrode 23 is destructed and the lower electrode 23 and upper electrode 28 are connected. If not using a repairing laser apparatus, defective cells can be replaced with redundant cells.</p> |
申请公布号 |
JP2000012699(A) |
申请公布日期 |
2000.01.14 |
申请号 |
JP19980370109 |
申请日期 |
1998.12.25 |
申请人 |
HYUNDAI ELECTRONICS IND CO LTD |
发明人 |
MI RAN KIM;MYUN SHIKU CHAN;JIN KOOKU KIM |
分类号 |
H01L21/82;G11C29/04;H01L21/66;H01L21/8246;(IPC1-7):H01L21/82;G11C29/00 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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