发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To improve reliability of connection and yield when making a semiconductor by laminating a plurality of bare chips. SOLUTION: A long wiring containing insulation film 4 comprises, for example, five consecutive unit films in the one dimensional direction, each of which is for one bare chip. The insulation film 4 is folded alternatively by about 180 degrees for every unit films 5 and the bare chips 2 are mounted on every unit films 5. A plurality of bare chips 2 is laminated in the depth direction as a whole. Then, all the bare chips 2 are wrapped by fixing the end of the wiring containing insulation film with the lowest bare chip 2 to form a semiconductor device 1.
申请公布号 JP2000012606(A) 申请公布日期 2000.01.14
申请号 JP19980177445 申请日期 1998.06.24
申请人 NEC CORP 发明人 IWASE KANJI
分类号 H01L25/18;H01L21/60;H01L23/538;H01L25/065;H01L25/07;(IPC1-7):H01L21/60 主分类号 H01L25/18
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