SEMICONDUCTOR DEVICE AND LIQUID CRYSTAL DRIVING DEVICE

摘要

PROBLEM TO BE SOLVED: To perform a test on multi-pin output ICs without increasing the size of a semiconductor chip or probing an output terminal by performing the test on the output terminal through the use of the off-transistor of a circuit for preventing an electrostatic breakdown in a semiconductor device and a testing circuit. SOLUTION: An output terminal 11 is connected to the output of an output- stage transistor part 6 formed of a Pch transistor 4 to connect an IC power source VCC17 to a source and a control signal 10 to a gate and of a Nch transistor 5 to connect an IC power source VGND18 to the source and the control signal 10 to the gate and is connected to a circuit 3 for preventing electrostatic breakdown. The device 3 for preventing electrostatic breakdown is constituted of a Pch transistor 1 to connect the IC power source VCC17 to the source and a test signal 12 to the gate and of a Nch transistor 2 to connect the IC power source VGND18 to the source and a test signal 13 to the gate. The IC power sources VCC17 and VGND18 are supplied from an external power source 16 via ammeters 14 and 15 for test.