发明名称 SUBSTRATE-INSPECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an inspecting device for visually observing a surface by maintaining a stage to be small regardless of the size of a substrate. SOLUTION: In an inspection device with an observation optical system for the surface of an object 1 to be inspected, an observation optical system is provided with objective optical systems 2 and 3 for forming the image of the object 1 to be inspected, relay optical systems 5, 6, 9, and 10 for forming the image of the object 1 to be inspected being formed by the objective optical systems 2 and 3 again, and an observation system 13 for observing the image of the object 1 to be inspected being formed by the relay optical systems again, the relay optical system is provided with first relay systems 5 and 6 for condensing light via the objective optical systems 2 and 3, and second relay systems 9 and 10 for condensing light through the first relay system, and a first arm 53 for retaining the first relay systems and a second arm 54 for retaining the second relay systems while being connected to the first arm turnably are arranged.
申请公布号 JP2000009651(A) 申请公布日期 2000.01.14
申请号 JP19980195024 申请日期 1998.06.25
申请人 NIKON CORP 发明人 KOMATSU KOICHIRO
分类号 G01N21/84;G01M11/00;G02F1/13;(IPC1-7):G01N21/84 主分类号 G01N21/84
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