| 摘要 |
PROBLEM TO BE SOLVED: To obtain a semiconductor device with an I/O buffer cell capable of implementing highly accurate timing verification test. SOLUTION: A phase comparator 2 performs phase comparison on data DATA and a clock CLK and outputs the results of phase comparison to one input of a multiplexer(MUX) 3. A test mode signal STM1 inputted form a test mode terminal 14 is supplied for the control input of the MUX 3 via a test mode input part 4. The MUX 3 receives an output signal of an internal logic 50 at the other input via a signal input part 9 and inputs either one of the results of comparison or the output signal of the internal logic 50 to the input part of a driver 8 on the basis of the test mode signal STM1. |
