发明名称 METHOD FOR MEASURING ABSOLUTE REFLECTANCE
摘要 <p>PROBLEM TO BE SOLVED: To measure the absolute reflectance of a member to be measured using a light receiving member secured to one point. SOLUTION: A polarizing member 3 is set removably above a luminous flux connecting a light source 1 and a light receiving member 2. Under a state where a member to be measured is not inserted, outgoing luminous flux from the polarizing member 3 is introduced to the light receiving member 2 through first, second, third and fourth mirrors 4, 5, 6, 7 fixed at specified angles and first luminous intensity is measured. Reflective face 8a' of a member 8 to be measured is then aligned with the reflective face 4a' of the first mirror 4 and reflected luminous flux is shifted to a position symmetric to the luminous flux connecting the light source 1 and the light receiving member 2 and introduced to the light receiving member 2 where second luminous intensity is measured and absolute reflectance is determined from the ratio of first and second luminous intensities.</p>
申请公布号 JP2000009593(A) 申请公布日期 2000.01.14
申请号 JP19980180169 申请日期 1998.06.26
申请人 MAMIYA OP CO LTD 发明人 IWAI MINORU
分类号 G01N21/55;G01M11/02;(IPC1-7):G01M11/02 主分类号 G01N21/55
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