| 摘要 |
<p>The invention relates to an X-ray examination apparatus for forming X-ray images of an object. An X-ray examination apparatus of this kind includes an X-ray source, an X-ray filter for adjusting the two-dimensional distribution of an X-ray beam to be generated on the object and an X-ray detector. The X-ray filter includes capillary tubes whose inner sides are provided with an electrically conductive layer and one end of which communicates with a reservoir containing an X-ray absorbing liquid. For each capillary tube the quantity of X-ray absorbing liquid can be adjusted by way of an electric voltage applied across the inner side of the capillary tube and the X-ray absorbing liquid. The X-ray filter is arranged between the object and the X-ray source, the tubes of the X-ray filter being arranged such that the tubes of the X-ray filter are arranged such that lines through all longitudinal axes of the tubes are intersecting lines extending through the X-ray source via the X-ray filter to the X-ray detector. In this way X-rays to be generated, starting from the X-ray source travelling via the X-ray filter to different points of the detector traverse a substantial part of the X-ray absorbing liquid in at least one of the capillary tubes.</p> |
