发明名称 RADIO FREQUENCY IDENTIFICATION SYSTEM AND METHOD FOR TRACKING SILICON WAFERS
摘要 A system and method for tracking semiconductor wafers through processing operations performed at a plurality of stations. A reader reads information relating to and identifying the wafers from a tag mounted on a wafer carrier. The tag has a memory which includes a plurality of pages storing the information. A plurality of antennas, each located proximate to one or more of the stations, are connected to the reader. The antennas each have a transmission range which defines a reader position and the reader and tag communicate by radio frequency signals via one of the antennas when the carrier is at the respective reader position. A host computer and reader communicate in accordance with an interface protocol by which the host computer commands the reader to read the stored information from one or more selected tag pages and the reader provides the stored information read from the selected tag pages to the host computer. The host computer processes the stored information read by the reader to track the wafers.
申请公布号 WO0002236(A2) 申请公布日期 2000.01.13
申请号 WO1999US15276 申请日期 1999.07.07
申请人 MEMC ELECTRONIC MATERIALS, INC. 发明人 MABRY, FRANK, R.;RHODES, JAMES, S.
分类号 G03F7/20;G06K17/00;H01L21/00;(IPC1-7):H01L21/00 主分类号 G03F7/20
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