发明名称 Crack-resistant semiconductor package and fabrication method thereof and fabrication apparatus thereof
摘要 A crack-resistant fabrication method and fabrication apparatus for a semiconductor package prevents interface isolation and cracks by coating a semiconductor chip disposed in a semiconductor package, a paddle of a lead frame, bonding wires and a bond paste using a polyimide type coating material. The coating material forms a coating film to act as a buffering member. The fabrication method can include the steps of attaching a semiconductor chip on a paddle, electrically coupling the semiconductor chip and leads, forming a coating film on the surfaces of the semiconductor chip and the leads, and molding the semiconductor chip, the leads, and the coating film.
申请公布号 US6013109(A) 申请公布日期 2000.01.11
申请号 US19970901628 申请日期 1997.07.28
申请人 LG SEMICON CO., LTD. 发明人 CHOI, SIHN
分类号 H01L23/28;H01L21/56;H01L23/31;H01L23/34;(IPC1-7):H01L21/44 主分类号 H01L23/28
代理机构 代理人
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