发明名称 Semiconductor structure for thermal shutdown protection
摘要 A semiconductor structure having a temperature sensor placed in close proximity to gate and source and/or drain electrodes. The sensor is compatible with conventional semiconductor processing and is typically made from doped polysilicon having a large temperature coefficient of resistivity. At least one sensor may be placed under, but insulated from, source or drain electrodes to protect against high electric fields. The sensor is also compatible with bipolar semiconductor structures.
申请公布号 US6013934(A) 申请公布日期 2000.01.11
申请号 US19970819828 申请日期 1997.03.18
申请人 LUCENT TECHNOLOGIES INC. 发明人 EMBREE, MILTON LUTHER;SHIBIB, MUHAMMED AYMAN
分类号 H01L27/02;H01L29/78;(IPC1-7):H02H9/02 主分类号 H01L27/02
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