发明名称 Bubble monitor for semiconductor manufacturing
摘要 Apparatus for monitoring the hydrogen peroxide concentration in a sulfuric acid bath used to remove photoresist from semiconductor wafers uses the amount of bubbles in the fluid mixture to signal the addition of hydrogen peroxide. The bubbles are directly related to the hydrogen peroxide in sulfuric acid mixture. The bubbles are sensed by a light source and photoelectric sensor connected to a threshold adjustment control which controls a metering solenoid valve to add hydrogen peroxide from a reservoir to the bath when the bubbles decrease.
申请公布号 US6013156(A) 申请公布日期 2000.01.11
申请号 US19980034084 申请日期 1998.03.03
申请人 ADVANCED MICRO DEVICES, INC. 发明人 HOLBROOK, ALLISON;HUANG, JIAHUA;FERNANDES, AARON A.
分类号 H01L21/00;(IPC1-7):C23F1/02 主分类号 H01L21/00
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