| 摘要 |
PROBLEM TO BE SOLVED: To provide a multiple reflection measuring apparatus by which a multiple reflection can be measured quantitatively. SOLUTION: A holding part 3 which holds a light transmission member 2 having a light transmission layer 20 is provided. An inspection light source 4 which makes inspection light B incident on the light transmission member 2 at an angle of incidenceαtilted with respect to the normal line S of the light transmission layer 20 on the light transmission member 2 held by the holding part 3 is provided. A light receiving member 5 by which a main reflected image K2 based on the reflection of the inspection light B at the light transmission member 2 and a ghost image H2 as a subreflected image are received is provided in such a way that the degree of the multiple reflection of the light transmission member 2 can be judged on the basis of the intervalΔM between the main reflected image K2 and the ghost image H2 a the subreflected image.
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