| 摘要 |
PROBLEM TO BE SOLVED: To specify the phase difference and the direction of an optical axis with a simple optical system, by measuring the elliptical rate of a light beam through a sample and the angle between an elliptical long axis and incidence straight-line polarization. SOLUTION: A light beam emitted from a light source 1 is propagated in Z-axis direction, and transmission light of an analyzer 2 is converted into straight-line polarization in X-axis direction. The transmission light of the analyzer 2 generally becomes an elliptical polarization with a long axis in the direction of an angle ofθ=θmax for an incidence straight-line polarization direction (X-axis direction). Then, by rotating an analyzer 4 around a light axis (Z axis) and measuring the output of a photo detector 5, inclination anglesθmax andθmin of the long and short axes for the incidence polarization direction (X axis) are obtained from light intensity Imax and Imin corresponding to the long and short axes of elliptical polarization and the rotary angle of the analyzer 4. By using these values, a phase differenceΔof a sample 3 and an angle formed by the sample 3 and the incidence polarization (namely, an azimuth angleαof the optical axis of the sample 3) can be calculated.
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