发明名称 METHOD FOR MEASURING LIQUID CRYSTAL LAYER THICKNESS AND TWIST ANGLE IN LIQUID CRYSTAL DEVICE
摘要 PROBLEM TO BE SOLVED: To measure liquid crystal layer thickness and twist angle of a twisted nematic liquid crystal cell with high precision. SOLUTION: The method for measuring utilizes an optical system which consists of a pair of polarizing plates 1, 2 having optical axes parallel to each other located so as to hold a liquid crystal cell 3 to be measured between them. The first chromaticity is calculated based on spectral distribution of a transmitted light measured by locating the optical axes of the polarizing plates 1, 2 in a direction of an orientation processing of a substrate at an incident light side of the liquid crystal cell 3 and the first angle of inclination of a straight line connecting the first chromaticity point and the achromatic point expressed on the chromaticity diagram is sought. Subsequently the second chromaticity is calculated based on spectral distribution of a transmitted light measured by locating the optical axes of the polarizing plates 1, 2 in a direction intersecting with about 45 deg. angle the direction of the orientation processing of the substrate at the incident light side and the second angle of inclination of a straight line connecting the second chromaticity point and the achromatic point is sought on the chromaticity diagram. Based on the first and the second angles of inclination a cell gap and twist angle of the TN(twisted nematic) liquid crystal cell 3 to be measured are obtained.
申请公布号 JP2000002864(A) 申请公布日期 2000.01.07
申请号 JP19980181347 申请日期 1998.06.15
申请人 CASIO COMPUT CO LTD 发明人 FUJII HIROYUKI
分类号 G02F1/13;G02F1/1335 主分类号 G02F1/13
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