| 摘要 |
PROBLEM TO BE SOLVED: To obtain an eddy current test probe in which a sufficient flaw detection S/N ratio can be ensured. SOLUTION: An exciting coil 2 is formed on one insulating film substrate by connecting a pair of reverse spiral coil parts 21, 22 and a detection coil 3 is formed spirally in one direction on the other insulating film substrate. These insulating film substrate are laminated vertically to form a coil pair and a flaw signal is obtained from the detection coil 3 by supplying an exciting current to the exciting coil 2.
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