发明名称 METHOD FOR FORMING MONOCRYSTALLINE SILICON LAYER, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
摘要 Monocrystalline silicon is deposited by a catalyst CVD method by using a crystalline sapphire layer (50) formed on an insulating substrate (1) as the seeds, and a silicon epitaxial layer (7) is formed. P-type impurity ions are implanted into a monocrystalline silicon layer, and then N-type impurity ions are implanted to make a P-channel MOS transistor portion a monocrystalline silicon layer (14). In a monocrystalline silicon layer (11), an N<+> source region (20) and drain region (21) of an N-channel MOS transistor are formed. Thus, a silicon layer is epitaxially grown uniformly at low temperature.
申请公布号 WO0001005(A1) 申请公布日期 2000.01.06
申请号 WO1999JP03522 申请日期 1999.06.30
申请人 SONY CORPORATION;YAMOTO, HISAYOSHI;YAMANAKA, HIDEO;SATOU, YUICHI;YAGI, HAJIME 发明人 YAMOTO, HISAYOSHI;YAMANAKA, HIDEO;SATOU, YUICHI;YAGI, HAJIME
分类号 C30B25/02;H01L21/20;H01L21/205;H01L21/336;H01L21/762;H01L21/77;H01L21/84;H01L21/86;H01L29/786;(IPC1-7):H01L21/205 主分类号 C30B25/02
代理机构 代理人
主权项
地址