Vorrichtung und Verfahren zur quantifizierten Bestimmung der Qualität beschichteter Oberflächen

摘要

The invention relates to a device for quantitatively determining the quality of coated surfaces. Said device comprises a first optical equipment with a light source which can be directed onto a measuring surface with a first predetermined angle; a second optical equipment with a photosensitive sensor which is oriented towards said measuring surface with a second predetermined angle and which receives light reflected by the measuring surface; a control device comprising a processor equipment and adapted to control the measuring process and finally an output equipment. Said device comprises a layer-thickness measuring device having a layer-thickness sensor which generates an electrical layer-thickness signal indicative of the thickness of the layer to be determined before determining the layer-thickness of the coating applied to the surface. Said control equipment determines a layer-thickness value through evaluation of the output layer-thickness signal and determines an optical parameter characteristic of said measuring surface through the light reflected by the measuring surface. Said output equipment displays the layer-thickness value and/or said optical parameter(s).