发明名称 Halbleiteranordnung mit Schmelzsicherung
摘要 A semiconductor device with a fuse comprises: a semiconductor substrate (31); a field oxide layer (36); a fuse (35) formed on the field oxide layer (36); an insulating layer (37) over the fuse (35) and the field oxide layer (36); a passivation layer (38) formed on the insulating layer (37) and having an opening above the fuse (35); and a nitride layer (39) formed on the passivation layer (38). It also comprises a metal guard ring (41) which surrounds a narrow blowable portion (35A) of the fuse (35), and is formed under the passivation layer (38) to extend to the semiconductor substrate (31) through the insulating layer (37) and the field oxide layer (36). The semiconductor substrate (31) consists of a base semiconductor substrate (32) and an epitaxial semiconductor layer (33) and is provided with an isolation region (34) which region is formed in the epitaxial semiconductor layer (33) so as to completely surround and isolate a portion (33A) of the epitaxial layer below the narrow portion (35A), and the metal guard (41) that comes into direct contact with the isolation region (34). <IMAGE>
申请公布号 DE69230359(D1) 申请公布日期 2000.01.05
申请号 DE1992630359 申请日期 1992.09.03
申请人 FUJITSU LTD., KAWASAKI 发明人 ENDO, TORU;OKAJIMA YOSHINORI FUJITSU LIMITED, OKAJIMA YOSHINORI FUJITSU LIMITED
分类号 H01L21/82;H01L23/525;(IPC1-7):H01L23/525 主分类号 H01L21/82
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