发明名称 Ellipsometric method and control device for making a thin-layered component
摘要 A method for controlling the production of an object controlled by a gas panel, by performing an ellipsometric measurement on the object represented by its Mueller matrix; controlling, with a gas panel, the manufacture on the basis of the ellipsometric measurement. Certain parameters of the Mueller matrix are determined in advance, for characterizing the manufacture, and only these parameters are extracted from the ellipsometric measurement during manufacture, the parameters being two different parameters of the ellipsometric angles psi and Delta and trigonometric functions thereof.
申请公布号 AU4049499(A) 申请公布日期 2000.01.05
申请号 AU19990040494 申请日期 1999.06.11
申请人 CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE 发明人 BERNARD DREVILLON
分类号 G01N21/21;C23C14/54;C23C16/52;C30B25/16;G01B11/06;G01J4/00;H01L21/205;H01L21/66 主分类号 G01N21/21
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