| 摘要 |
Apparatus for the electrical testing of electrical circuits including at least one array of non-contact stimulator electrodes having a multiplicity of individually controlled stimulator electrodes arranged to be linearly disposed adjacent a first side of an electrical circuit to be tested; a signal generator coupled to the at least one array arranged to supply an electrical stimulation signal to each of the stimulator electrodes; and at least two non-contact sensor electrodes, each having dimensions sufficiently large to overlay part of a conductor on the electrical circuit to be tested. |
