| 摘要 |
A semiconductor package is provided that includes a semiconductor chip that is mounted on a mount board with metal bumps interposed therebetween so as to create a gap. A structure is provided in the gap for limiting the flow of a resin, which is deposited along side the semiconductor chip, around the peripheral portion of the semiconductor chip. The structure increases the resistance to the flow of the resin in the peripheral portion of the semiconductor chip. Therefore, the rate at which the resin flows in the peripheral portion of the semiconductor chip is made lower than the rate at which the resin flows near the central portion of semiconductor chip. Accordingly, the formation of a resin-less void in the gap is suppressed so that the grade and quality of the semiconductor device is improved. In one embodiment, the structure in the gap includes projections provided on a portion of the mount board that corresponds to the peripheral portion of the semiconductor chip. In another embodiment, the structure in the gap includes protruding, portions provided on portions of the mount board that correspond to side portions of the semiconductor chip. The protruding portions make the size of the gap near the central portion of the semiconductor chip larger than size of the gap near the side portions of the semiconductor chip.
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