发明名称 Independent gas feeds in a plasma reactor
摘要 A plasma etch reactor having independent gas feeds above the wafer and either at the sides or below the wafer. Preferably, a carrier gas such as argon is supplied from a showerhead electrode above the wafer while an etching gas is supplied from below. In the case of selectively etching an oxide over a non-oxide layer, the etchant gas should include one or more fluorocarbons.
申请公布号 US6009830(A) 申请公布日期 2000.01.04
申请号 US19970975907 申请日期 1997.11.21
申请人 APPLIED MATERIALS INC. 发明人 LI, HAOJIANG;WU, ROBERT W.
分类号 H01J37/32;H01L21/311;(IPC1-7):C23C16/00 主分类号 H01J37/32
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