发明名称 |
Self aligned contact with interlayer to fill spaces between stacked patterns with contact holes and spacers on sidewalls of patterns |
摘要 |
Self aligned contact is formed on a semiconductor device. An interlayer (10) fills spaces between stacked patterns formed over the substrate (100). The interlayer is etched using a mask pattern down to the surface of the substrate to form contact holes and spacers on sidewalls of patterns. The mask pattern is removed and the holes are filled with a second conductive layer. Self aligned contact is formed on a semiconductor device by forming spaced stacked patterns over a substrate with active (101) and inactive regions. Each stacked pattern has a conductive layer and insulating layer. A second insulating layer is formed with an interlayer insulating layer to fill spaces between patterns. The interlayer is etched using a mask pattern down to the surface of the substrate to form contact holes and spacers on sidewalls of patterns. The mask pattern is removed and the holes are filled with a second conductive layer.
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申请公布号 |
DE19925657(A1) |
申请公布日期 |
1999.12.23 |
申请号 |
DE19991025657 |
申请日期 |
1999.06.04 |
申请人 |
SAMSUNG ELECTRONICS CO. LTD., SUWON |
发明人 |
CHO, CHANG-HYUN;LEE, KYU-HYUN;LEE, JAE-GOO;JEONG, SANG-SUB |
分类号 |
H01L21/28;H01L21/336;H01L21/60;H01L21/768;H01L29/78;(IPC1-7):H01L21/283;H01L21/823 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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