发明名称 Self aligned contact with interlayer to fill spaces between stacked patterns with contact holes and spacers on sidewalls of patterns
摘要 Self aligned contact is formed on a semiconductor device. An interlayer (10) fills spaces between stacked patterns formed over the substrate (100). The interlayer is etched using a mask pattern down to the surface of the substrate to form contact holes and spacers on sidewalls of patterns. The mask pattern is removed and the holes are filled with a second conductive layer. Self aligned contact is formed on a semiconductor device by forming spaced stacked patterns over a substrate with active (101) and inactive regions. Each stacked pattern has a conductive layer and insulating layer. A second insulating layer is formed with an interlayer insulating layer to fill spaces between patterns. The interlayer is etched using a mask pattern down to the surface of the substrate to form contact holes and spacers on sidewalls of patterns. The mask pattern is removed and the holes are filled with a second conductive layer.
申请公布号 DE19925657(A1) 申请公布日期 1999.12.23
申请号 DE19991025657 申请日期 1999.06.04
申请人 SAMSUNG ELECTRONICS CO. LTD., SUWON 发明人 CHO, CHANG-HYUN;LEE, KYU-HYUN;LEE, JAE-GOO;JEONG, SANG-SUB
分类号 H01L21/28;H01L21/336;H01L21/60;H01L21/768;H01L29/78;(IPC1-7):H01L21/283;H01L21/823 主分类号 H01L21/28
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