发明名称 Verfahren zur Bestimmung der Lage P eines Strukturelementes auf einem Substrat
摘要 The invention relates to a method for determining the distance P of an edge of a structural element (16) which is non-orthogonal in relation to the coordinate axes (x, y) of a substrate. The structural element (16) is represented on a detector array (13), having a reference point (14), of a charge-coupled device camera. By means of a measurement window (17) rotated at an angle THETA to the coordinate system, the distance PIPC of an edge of the structural element (16) relative to the reference point (14) is determined. The distance L of the reference point (14) to the origin of the coordinate system is determined via the angle THETA and the current measuring table coordinates (x, y) so that the distance P is obtained by P = PIPC + L, where L = x•cos THETA y•sin THETA .
申请公布号 DE19825829(A1) 申请公布日期 1999.12.23
申请号 DE19981025829 申请日期 1998.06.10
申请人 LEICA MICROSYSTEMS WETZLAR GMBH 发明人 RINN, KLAUS
分类号 G01B11/00;G01B11/02;G01B11/03;G06T7/60;(IPC1-7):G01B11/03;G01B11/26;G01J1/42;G03F9/00;H01L21/66 主分类号 G01B11/00
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