发明名称 |
Sensor and measuring apparatus using the same |
摘要 |
<p>A highly sensitive sensor and measuring apparatus are provided by using a sensitive change in the reflection spectrum of metal microparticles present on a metal surface according to a change of dielectric constant in the surrounding area. <IMAGE></p> |
申请公布号 |
EP0965835(A2) |
申请公布日期 |
1999.12.22 |
申请号 |
EP19990109794 |
申请日期 |
1999.05.18 |
申请人 |
HITACHI, LTD. |
发明人 |
TAKEI, HIROYUKI;SAKAMOTO, TAKESHI |
分类号 |
G01N21/27;G01N21/41;G01N33/543;G01N33/553;(IPC1-7):G01N21/55 |
主分类号 |
G01N21/27 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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