发明名称 Method and apparatus for ionizing a sample under atmospheric pressure and selectively introducing ions into a mass analysis region
摘要 A method in which cutting of small droplets, neutral particles or photons through to a slit provided between a differential pumping portion and a mass analysis portion is combined with slight deflection of ions just before introduction of the ions into the mass analysis portion so that noises are greatly reduced without reduction of signals to thereby improve the signal-to-noise ratio which is an index of detecting sensitivity or lower limit.
申请公布号 US6005245(A) 申请公布日期 1999.12.21
申请号 US19970919785 申请日期 1997.08.29
申请人 HITACHI, LTD. 发明人 SAKAIRI, MINORU;MIMURA, TADAO;TAKADA, YASUAKI;NABESHIMA, TAKAYUKI;KOIZUMI, HIDEAKI
分类号 H01J49/04;(IPC1-7):H01J49/06 主分类号 H01J49/04
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