发明名称 Semiconductor device with conductive plugs
摘要 In a method of manufacturing a semiconductor device, a CMOS section composed of an N-channel MOS transistor and a P-channel MOS transistor and a memory section composed of at least a transfer gate MOS transistor is formed on a substrate. A plurality of conductive plugs is formed to penetrate a laminate insulating film to the MOS transistors. The laminate insulating film is composed of a first insulating film and a second insulating film. A capacitor section is formed on the laminate insulating film and the capacitor section is composed of an upper electrode, a dielectric film and a lower electrode. A third insulating film is formed on the laminate insulating film and the capacitor section. A wiring pattern is formed on the third insulating film to partially penetrate the second insulating film connect to the plurality of conductive plugs. A wiring pattern may be disposed in the laminate insulating film to connect at least two of the plurality of conductive plugs.
申请公布号 US6004839(A) 申请公布日期 1999.12.21
申请号 US19970804112 申请日期 1997.02.20
申请人 NEC CORPORATION 发明人 HAYASHI, YOSHIHIRO;TANABE, NOBUHIRO;TAKEUCHI, TSUNEO;SAITO, SHINOBU
分类号 H01L21/768;H01L21/8242;H01L21/8246;(IPC1-7):H01L21/823;H01L21/824 主分类号 H01L21/768
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