发明名称 |
Computer control shear cell tester |
摘要 |
A computer controlled shear cell (CCSC) tester for bulk solids, especially powders, that allows the determination of a Yield Locus curve from a single test procedure. The principle of the CCSC is that yield states can be maintained in a test cell over a range of normal and shear stresses in the same test. This leads directly to a Yield Locus curve. With its flexible design, the CCSC can also be used as a Jenike shear cell or a direct shear cell. Use of the CCSC allows the testing time and amount of material needed for testing to be reduced as compared to current testing methods.
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申请公布号 |
US6003382(A) |
申请公布日期 |
1999.12.21 |
申请号 |
US19980104650 |
申请日期 |
1998.06.25 |
申请人 |
THE PENN STATE RESEARCH FOUNDATION |
发明人 |
PURI, VIRENDRA M.;LADIPO, DAUDA D. |
分类号 |
G01N3/24;(IPC1-7):G01N3/24 |
主分类号 |
G01N3/24 |
代理机构 |
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