| 摘要 |
The invention concerns a method and a device for optoelectric acquisition of the shape of a surface, by illuminating the surface (S) using light beams (1 0) with different wavelengths and which converge in different points on the illumination axial direction (Y) in the surface (S) proximity, by spectral analysis of the light reflected or backscattered by the surface (S) in direction (Y) and by determining the distances of the surface (S) points wit h respect to a reference plane (X, Z) from the wavelengths and/or the analysed light spectral widths.
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