发明名称 Semiconductor component trench isolation structure
摘要 A semiconductor component trench isolation structure includes pseudo-active zones (13) within a field insulation zone (12). A semiconductor component isolation structure comprises filled trenches (40) between a field insulation zone (12), pseudo-active zones (13) and an active zone (11) of a semiconductor substrate (10). An Independent claim is also included for production of the above isolation structure.
申请公布号 DE19854187(A1) 申请公布日期 1999.12.16
申请号 DE19981054187 申请日期 1998.11.24
申请人 LG SEMICON CO., LTD. 发明人 AHN, JAE-GYUNG
分类号 H01L21/76;H01L21/762;H01L21/765;(IPC1-7):H01L21/765 主分类号 H01L21/76
代理机构 代理人
主权项
地址