Tolerant integrated circuit to great manufacturing faults

摘要

The integrated circuit tolerant of large manufacturing defects comprising a first plurality of first conductors (CO1) made of a first material with relatively low conductivity and each having a plurality of first electrical connection points (CP) arranged along itself and a second corresponding plurality of second conductors (CO2) made of a second material with relatively high conductivity and each having a plurality of second electrical connection points (CP) arranged along itself and said plurality of first points are electrically connected to said plurality of second points respectively in such a manner as to reduce the series resistance of the first conductors and the second conductors (CO2) are interrupted between some second consecutive points (CP) in such a manner as to leave relatively large areas of the integrated circuit not traversed by the second conductors (CO2).